Yazar "MEKIDECHE, Mohamed Rachid" için Scopus İndeksli Yayınlar Koleksiyonu listeleme
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An approach based on ANFIS and input selection procedure for microwave characterization of dielectric materials
SADOU, Hakim; HACIB, Tarik; AÇIKGÖZ, Hulusi; LE BIHAN, Yan; MEYER, Olivier; MEKIDECHE, Mohamed Rachid (Emerald Group Publishing Ltd., 2018)Purpose: The principle of microwave characterization of dielectric materials using open-ended coaxial line probe is to link the dielectric properties of the sample under test to the measurements of the probe admittance ...
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