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dc.contributor.authorSADOU, Hakim
dc.contributor.authorHACIB, Tarik
dc.contributor.authorLE BIHAN, Yan
dc.contributor.authorAÇIKGÖZ, Hulusi
dc.contributor.authorMEYER, Olivier
dc.date.accessioned2020-08-07T12:55:54Z
dc.date.available2020-08-07T12:55:54Z
dc.date.issued2017
dc.identifier10.1109/CEFC.2016.7816381
dc.identifier.issn9781509010325 (ISBN)
dc.identifier.urihttp://hdl.handle.net/20.500.12498/2976
dc.description.abstractInverse problems for determination of dielectric materials properties (complex permittivity) are usually solved by iterative methods using numerically based forward model. These methods are computationally expensive. In this paper, we propose a fast inversion model based on partial least square regression (PLSR). The idea is to build a model able to predict in real time the properties of the sample under test using measurements of admittance or reflexion coefficient of the propagating electromagnetic micro wave along the coaxial line. Numerical solution of the direct problem is made using Finite Element Method (FEM). © 2016 IEEE.
dc.language.isoEnglish
dc.publisherInstitute of Electrical and Electronics Engineers Inc.
dc.source17th Biennial IEEE Conference on Electromagnetic Field Computation, IEEE CEFC 2016
dc.source.urihttps://ieeexplore.ieee.org/document/7816381
dc.titleMicrowave characterization using partial least square regression
dc.typeKonferans Bildirisi


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